Coupling Faults Detection In Memories Using With Finite State Machine And Microcode Based And Microcode Based Memory Built In Self Test(Mbist)
DOI:
https://doi.org/10.61841/pjbgnc27Keywords:
Built in self test, FSM, Coupling faults, march Sam, fault, FPGAAbstract
Built-in Self-Test, or BIST, is the technique of designing additional hardware and software features into integrated circuits to allow them to perform self-testing, testing of their own operation using their own circuits, thereby reducing dependence on external automated test equipment (ATE). BIST is also the solution to the testing of critical circuits that have no direct connections to external pins, such as embedded memories used internally by the devices. In the near future, even the most advanced tester may no longer be adequate for the fastest chip, a situation wherein self-testing may be the best solution. Microcode-based and FSM-based controllers are two widely known architectures used for programmable memory built-in self-test. These techniques are popular because of their flexibility of programming new test algorithms. In this paper, the architectures for both controllers are designed to implement a new test algorithm MARCH SAM that gives a better fault coverage in detecting single-cell fault and all intra-word coupling fault (CF).The components of each controllers are studied and designed. The both of the controller are written using Verilog HDL and implemented FPGA. The simulation and synthesis results of both architectures are presented.
Downloads
References
[1] Manoharan, Rajesh, et al. “Selection of Intermediate Routes for Secure Data Communication Systems using Graph Theory Application and Grey Wolf Optimization Algorithm in MANETs.” IET Networks, 2020.
[2] Rajesh, M., & Gnanasekar, J. M. “Path Observation Based Physical Routing Protocol for Wireless Ad Hoc Networks.” Wireless Personal Communications, vol. 97, pp. 1267–1289, 2017. https://doi.org/10.1007/s11277-017-4565-9
[3] Rajesh, M. “Streamlining Radio Network Organizing Enlargement Towards Microcellular Frameworks.” Wireless Personal Communications, 2020. https://doi.org/10.1007/s11277-020-07336-9
[4] Bui, T. Q., Pham, L. D., Nguyen, H. M., Nguyen, V. T., Le, T. C., & Hoang, T. “An Effective Architecture of Memory Built-In Self-Test for Wide Range of SRAM.” 2016, pp. 121–124.
[5] Becker, et al. “Burst Software Transparent On-line MBIST.”
Harutyunyan, G., Shoukourian, S., Vardanian, V., & Zorian, Y. “A new method for march test algorithm generation and its application for fault detection in RAMs.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 31, no. 6, pp. 941–949, 2012.
[6] Bui, T. Q., Pham, L. D., Nguyen, H. M., Nguyen, V. T., Le, T. C., & Hoang, T. “An effective architecture of memory built-in self-test for wide range of SRAM.” Proceedings of ACOMP 2016, pp. 121–124, 2017.
[7] “Original Image Bitstream Encoder Decoder Decoded Image.” IJARCS, vol. 5, no. 4, pp. 28–29, 2014.
[8] Huang, Y. J., Chou, C. W., & Li, J. F. “A Low-Cost Built-in Self-Test Scheme for an Array of Memories.” 2010 IEEE European Test Symposium (ETS), pp. 75–80, 2010.
[9] Moorthy, P., & Bharathy, M. S. S. “An Efficient Test Pattern Generator for High Fault Coverage in Built-In Self-Test Applications.” 2013, pp. 4–7.
[10] Shirur, Y. J. M., Bhimashankar, B. C., & Chakravarthi, V. S. “Performance Analysis of Low Power Microcode Based Asynchronous P-MBIST.” ICACCI 2015, pp. 555–560, 2015.
[11] Rao, Q. L., He, C., & Jia, Y. M. “A Memory Built-In Self-Test Architecture for Memories Different in Size.” ICTD 2009, 2009.
[12] Tsai, P., Wang, S., & Chang, F. “FSM-Based Programmable Memory BIST with Macro Command.” Memory, 2005.
[13] WonGi, H., JungDai, C., & Hoon, C. “A Programmable Memory BIST for Embedded Memory.” ISOCC 2008, vol. 2, pp. 195–198, 2008.
[14] WonGi, H., JungDai, C., & Hoon, C. “A Programmable Memory BIST for Embedded Memory.” ISOCC 2008, vol. 2, pp. 195–198, 2008.
Raj, N., Singh, A. K., & Gupta, A. K. “Low power high output impedance high bandwidth QFGMOS current mirror.” Microelectronics Journal, vol. 45, no. 8, pp. 1132–1142, 2014.
Raj, N., Singh, A. K., & Gupta, A. K. “Low-voltage bulk-driven self-biased cascode current mirror with bandwidth enhancement.” Electronics Letters, vol. 50, no. 1, pp. 23–25, 2014.
[15] Venkataraman, S., Rajski, J., Hellebrand, S., & Tarnick, S. “An Efficient BIST Scheme Based on Reseeding of Multiple Polynomial Linear Feedback Shift Registers.” Proc. Int. Conf. on Computer-Aided Design, pp. 572–577, November 1993.
[16] Hamzaoglu, I., & Patel, J. H. “New Techniques for Deterministic Test Pattern Generation.” Journal of Electronic Testing: Theory and Applications, vol. 15, no. 1/2, pp. 63–73, October 1999.
[17] Chakrabarty, K., & Murray, B. T. “Design of Built-In Test Generator Circuits Using Width Compression.” IEEE Transactions on Computer-Aided Design, vol. 17, no. 10, pp. 1044–1051, October 1998.
[18] Agrawal, V. D., Kime, C. R., & Saluja, K. K. “A Tutorial on Built-in Self Test (Part 1).” IEEE Design and Test of Computers, pp. 73–82, March 1993.
Downloads
Published
Issue
Section
License
This work is licensed under a Creative Commons Attribution 4.0 International License.
You are free to:
- Share — copy and redistribute the material in any medium or format for any purpose, even commercially.
- Adapt — remix, transform, and build upon the material for any purpose, even commercially.
- The licensor cannot revoke these freedoms as long as you follow the license terms.
Under the following terms:
- Attribution — You must give appropriate credit , provide a link to the license, and indicate if changes were made . You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use.
- No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.
Notices:
You do not have to comply with the license for elements of the material in the public domain or where your use is permitted by an applicable exception or limitation .
No warranties are given. The license may not give you all of the permissions necessary for your intended use. For example, other rights such as publicity, privacy, or moral rights may limit how you use the material.
